Revisiting Lateral-BTBT Gate-Induced Drain Leakage in Nanowire FETs for 1T-DRAM
Article in IEEE Transactions on Electron Devices (February 2024)
The most recent citing publications are shown below. View all 29 publications that cite this research output on Dimensions.
Article in IEEE Transactions on Electron Devices (February 2024)
Article in Nanomaterials (January 2024)
Conference proceeding (October 2023)