Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

Overview of attention for article published in Nature Communications, November 2020

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Above-average Attention Score compared to outputs of the same age (61st percentile)

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So far, Dimensions has found 5 publications that cite this research output.

5

The most recent citing publications are shown below. View all 5 publications that cite this research output on Dimensions.

Variability and Yield in h‐BN‐Based Memristive Circuits: The Role of Each Type of Defect

Article in Advanced Materials (September 2021)

The Rise of the Xenes: From the Synthesis to the Integration Processes for Electronics and Photonics.

Article in Materials (July 2021)

Probing and pushing the limit of emerging electronic materials via van der Waals integration

Article in MRS Bulletin (June 2021)